Die Attach Curing Program Automation of N2 Parameter for Process Robustness

Dinglasan, Jerome and Rosa, Rogel Dela and Gomez, Frederick Ray (2021) Die Attach Curing Program Automation of N2 Parameter for Process Robustness. Journal of Engineering Research and Reports, 20 (4). pp. 147-152. ISSN 2582-2926

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Abstract

In the world of semiconductor industry, automation plays a big role on every manufacturing plants to improve efficiency, prevent product yield losses, and making sure that top quality products will be delivered on end user. On die attach curing process of manufacturing semiconductor integrated circuits (IC) devices, certain problems occur like wrong Nitrogen (N2) parameter setting on the oven curing machine, with human intervention during setup, causing leadframe oxidation related defects. The paper discussed the importance of automation system on processing semiconductor IC products on die attach curing process, eliminating mostly human intervention on setting up machine parameters, storing and managing programs, restrict unauthorize users from accessing, provide friendly user procedures to prevent human errors and prevent oxidation related defects.

Item Type: Article
Subjects: Open STM Article > Engineering
Depositing User: Unnamed user with email support@openstmarticle.com
Date Deposited: 21 Mar 2023 06:58
Last Modified: 07 May 2024 05:16
URI: http://asian.openbookpublished.com/id/eprint/157

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